Electronica 24: Omron's Innovations in Electronic Inspection Technologies

EMS@C-LEVEL

Discover how inspection technologies are reshaping the future of manufacturing with insights from Grischa Wasmus of Omron. Promising a transformation in quality control, Grischa discusses Omron’s innovations, like their latest SPI system and the 3D SN80 AOI system, and explains the significance of the high-resolution X-ray solutions, VT-X750, X850, and X950, for PCB and semiconductor industries. Join us as we uncover the impact of inline X-ray machines on high-speed production lines and the emerging trend of integrating cross-discipline data to yield actionable insights.
In a conversation that bridges industries, Grischa and I delve into how Omron's Q-App Suite software connects various machines to enhance production efficiency. We explore the promising partnerships with companies like Fuji and Panasonic, which are creating real-time feedback loops for instant production line adjustments.
This episode offers a compelling look into the evolving landscape of electronic inspection and the quest for a more integrated, data-driven approach to manufacturing.
EMS@C-Level at electronica 2024 was hosted by IPC (https://www.ipc.org/)

Like every episode of EMS@C-Level, this one was sponsored by global inspection leader Koh Young (https://www.kohyoung.com).
You can see video versions of all of the EMS@C-Level pods on our YouTube playlist.